Publication Details

Using Model Checker to Analyze and Test Digital Circuits with Regard to Delay Faults

STRNADEL Josef. Using Model Checker to Analyze and Test Digital Circuits with Regard to Delay Faults. In: Proceedings of 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Vienna: Institute of Electrical and Electronics Engineers, 2021, pp. 111-114. ISBN 978-1-6654-3595-6.
Czech title
Využití ověřování modelů pro analýzu a testování číslicových obvodů s ohledem na poruchy zpoždění
Type
conference paper
Language
english
Authors
Keywords

digital circuit, timing, delay, fault, timed au­tomaton, model checking, counter-example, test case, test

Abstract

Narrow timing margins in modern digital circuits result in delay defects that are difficult to detect. The probability that such a defect occurs increases with factors such as shrinking feature sizes, increasing process variations, higher operating frequencies, and aging/stress of the circuits. Traditionally, timing is considered in connection with the logic design, physical design and layout, and delay testing phases of the circuit development process and builds on principles of delay characterization, fault models and timing analysis. This paper presents a model checking approach aiming to facilitate the solutions of problems with regard to analyzing consequences and testing of delay faults. Our approach expects that a circuit is modeled as a network stochastic hybrid timed automata capable to describe the circuit both in the logical and temporal domains, including facts such as uncertainty and variations. In our approach, we gather attributes and formalize expected properties of a circuit and transform the circuit into our model. Then, we use a statistical model checker to check the properties and to produce a counter-example for each property being violated. Further, we transform the counter-examples into test cases and finally, into a delay test able to check whether the timing requirements are met.

Published
2021
Pages
111-114
Proceedings
Proceedings of 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Conference
24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Vídeň, AT
ISBN
978-1-6654-3595-6
Publisher
Institute of Electrical and Electronics Engineers
Place
Vienna, AT
DOI
UT WoS
000672620200021
EID Scopus
BibTeX
@INPROCEEDINGS{FITPUB12433,
   author = "Josef Strnadel",
   title = "Using Model Checker to Analyze and Test Digital Circuits with Regard to Delay Faults",
   pages = "111--114",
   booktitle = "Proceedings of 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems",
   year = 2021,
   location = "Vienna, AT",
   publisher = "Institute of Electrical and Electronics Engineers",
   ISBN = "978-1-6654-3595-6",
   doi = "10.1109/DDECS52668.2021.9417069",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/12433"
}
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