The Unified Approach to Processor Testing

Type

conference paper

Language

english

Authors

Drábek Vladimír, doc. Ing., CSc. (DCSE FEECS BUT)

Abstract

The focus is concentrated on different design for testability approaches being used on current processors as full scan, partial scan, standard boundary scan, and so on. An unified approach to processor testing is being proposed, combining several optimised DFT techniques, formal verification and system-level testing.

Annotation

The focus is concentrated on different design for testability approaches being used on current processors as full scan, partial scan, standard boundary scan, and so on. An unified approach to processor testing is being proposed, combining several optimised DFT techniques, formal verification and system-level testing.

Published

1999

Pages

192-195

Proceedings

CE&I, Sci. Conf., Košice-Herlany, Slovakia

ISBN

80-88922-05-4

Place

Košice-Herlany, SK

BibTeX

@INPROCEEDINGS{FITPUB5623,
   author = "Vladim\'{i}r Dr\'{a}bek",
   title = "The Unified Approach to Processor Testing",
   pages = "192--195",
   booktitle = "CE\&I, Sci. Conf., Ko\v{s}ice-Herlany, Slovakia",
   year = 1999,
   location = "Ko\v{s}ice-Herlany, SK",
   ISBN = "80-88922-05-4",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/5623"
}