Detail publikace

RT Level Testability Analysis to Reduce Test Application Time

KOTÁSEK Zdeněk a ZBOŘIL František. RT Level Testability Analysis to Reduce Test Application Time. In: Proceedings of the EUROMICRO 97. Budapest: neznámá, 1997, s. 104-111. ISBN 0-8186-8129-2.
Název česky
Analýza testovatelnosti na úrovni RT k redukci času testu
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Kotásek Zdeněk, Doc. Ing., CSc. (UIVT-VVS FEI VUT)
Zbořil František, Doc. Ing., CSc. (UIVT FEI VUT)
Klíčová slova

RT Level Testability Analysis, Element Classification, PROLOG

Abstrakt

The paper describes the research activities the goal of which is to develop a methodology that solves the problem of the RT level testability analysis in a complex way. On the basis of the RT level testability analysis the reduction in test application time can be achieved. A new model of RT level elements classification for the purposes of the RT level testability analysis is described. The prescription for an RTL circuit transformation to a labelled directed graph and its representation in PROLOG environment are presented. The methodology for the RT level testability analysis and the principles of its implementation are described.

Rok
1997
Strany
104-111
Sborník
Proceedings of the EUROMICRO 97
Konference
EUROMICRO 97, Budapest, Hungary, HU
ISBN
0-8186-8129-2
Vydavatel
neznámá
Místo
Budapest, HU
BibTeX 
@INPROCEEDINGS{FITPUB6598,
   author = "Zden\v{e}k Kot\'{a}sek and Franti\v{s}ek Zbo\v{r}il",
   title = "RT Level Testability Analysis to Reduce Test Application Time",
   pages = "104--111",
   booktitle = "Proceedings of the EUROMICRO 97",
   year = 1997,
   location = "Budapest, HU",
   ISBN = "0-8186-8129-2",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/6598"
}
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