Publication Details

A/D Switched-Current Converter with Built-in Self Testing Features

VEČEŘA Ivo, VRBA Radimír and ŠVÉDA Miroslav. A/D Switched-Current Converter with Built-in Self Testing Features. In: Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics, 2002, Vol. III. Orlando: The International Institute of Informatics and Systemics, 2003, pp. 367-370. ISBN 980-07-8150-1.
Type
conference paper
Language
english
Authors
Večeřa Ivo, Ing. (FEEC BUT)
Vrba Radimír, prof. Ing., CSc. (CEITEC BUT)
Švéda Miroslav, prof. Ing., CSc. (DIFS FIT BUT)
Keywords

DFT, BIST, switched-current mode, A/D converter, fault model

Abstract

Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-current structure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current technique, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.

Published
2003
Pages
367-370
Proceedings
Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics, 2002, Vol. III
Conference
The 6th World Multi-Conference on Systemics, Cybernetics and Informatics, Orlando - Florida, US
ISBN
980-07-8150-1
Publisher
The International Institute of Informatics and Systemics
Place
Orlando, US
BibTeX 
@INPROCEEDINGS{FITPUB7126,
   author = "Ivo Ve\v{c}e\v{r}a and Radim\'{i}r Vrba and Miroslav \v{S}v\'{e}da",
   title = "A/D Switched-Current Converter with Built-in Self Testing Features",
   pages = "367--370",
   booktitle = "Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics, 2002, Vol. III",
   year = 2003,
   location = "Orlando, US",
   publisher = "The International Institute of Informatics and Systemics",
   ISBN = "980-07-8150-1",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7126"
}
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