Publication Details

The Test Controller Model Based on The Timed Automaton

MIKA Daniel and KOTÁSEK Zdeněk. The Test Controller Model Based on The Timed Automaton. In: Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems. Ostrava, 2003, pp. 107-114. ISBN 80-85988-86-0.
Czech title
Model řadiče testu založený na časovaném automatu
Type
conference paper
Language
english
Authors
Keywords

Register Transfer Level (RTL), Circuit Under Test (CUT), Test Controller Model

Abstract

In the paper the process of the test controller model design and synthesis on Register Transfer Level (RTL) is described. The principles of test application to circuit element by the test controller model is discussed. The problem of I-path is explained. The formal tool - the timed automaton - is used as a suitable tool for test controller model. In the end of paper there is a simple example of timed automaton, which represents a model of particular behavior of the test controller.

Published
2003
Pages
107-114
Proceedings
Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems
Conference
MOSIS 2003 - Modelling and Simulation of Systems, Brno, CZ
ISBN
80-85988-86-0
Place
Ostrava, CZ
BibTeX
@INPROCEEDINGS{FITPUB7172,
   author = "Daniel Mika and Zden\v{e}k Kot\'{a}sek",
   title = "The Test Controller Model Based on The Timed Automaton",
   pages = "107--114",
   booktitle = "Proceedings of 37th International Conference MOSIS03 Modelling and Simulation of Systems",
   year = 2003,
   location = "Ostrava, CZ",
   ISBN = "80-85988-86-0",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7172"
}
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