Faculty of Information Technology, BUT

Publication Details

Evaluation of Biometric Authentication Based on Visual Evoked Potentials

MALINKA Kamil, HANÁČEK Petr and TRZOS Michal. Evaluation of Biometric Authentication Based on Visual Evoked Potentials. In: Proceedings 45th International Carnahan Conference on Security Technology. Piscataway: Institute of Electrical and Electronics Engineers, 2011, pp. 13-19. ISBN 978-1-4577-0901-2.
Czech title
Zhodnocení biometrické autentizace založené na vizuálně evokovaných potenciálech
Type
conference paper
Language
english
Authors
Malinka Kamil, Mgr., Ph.D. (DITS FIT BUT)
Hanáček Petr, doc. Dr. Ing. (DITS FIT BUT)
Trzos Michal, Ing. (FEEC BUT)
Keywords
biometrics, authentication, behavioural patterns, unconditional reflexes, visual evoked potentials
Abstract
This article is dealing with biometric authentication. We propose an analysis of challenge-response approach usability together with an appropriate candidate for such an approach - visual evoked potentials (VEP). Their physiological properties and recognition capabilities are presented. We design and implement methods covering all phases necessary for processing VEP as a biometric characteristic and perform them on a test database. The efficiency of our approach is presented in an appropriate way. We also propose our design of a biometric authentication system based on the VEP characteristic.
Published
2011
Pages
13-19
Proceedings
Proceedings 45th International Carnahan Conference on Security Technology
Conference
45th IEEE INTERNATIONAL CARNAHAN CONFERENCE ON SECURITY TECHNOLOGY, Mataro, ES
ISBN
978-1-4577-0901-2
Publisher
Institute of Electrical and Electronics Engineers
Place
Piscataway, US
DOI
BibTeX
@INPROCEEDINGS{FITPUB9689,
   author = "Kamil Malinka and Petr Han\'{a}\v{c}ek and Michal Trzos",
   title = "Evaluation of Biometric Authentication Based on Visual Evoked Potentials",
   pages = "13--19",
   booktitle = "Proceedings 45th International Carnahan Conference on Security Technology",
   year = 2011,
   location = "Piscataway, US",
   publisher = "Institute of Electrical and Electronics Engineers",
   ISBN = "978-1-4577-0901-2",
   doi = "10.1109/CCST.2011.6095875",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/9689"
}
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