Result Details

VerTrace: An Open-Source Toolchain for Portable Stimulus Vertical Reuse

BARDONEK, P.; ZACHARIÁŠOVÁ, M. VerTrace: An Open-Source Toolchain for Portable Stimulus Vertical Reuse. In 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS). Marrakech, Morocco: IEEE, 2025. p. 1-4. ISBN: 979-8-3315-9585-2.
Type
conference paper
Language
English
Authors
Abstract

The Portable Test and Stimulus Standard (PSS) is a new standard used in the verification of hardware designs. It enables the reuse of abstract verification scenarios across platforms, design variants, and design hierarchies through portable models (PMs). The standard and use cases presented in the publications primarily focus on scenario creation and constraint solving within PMs, while the infrastructure for transforming abstract scenarios into executable tests remains largely manual. This paper presents VerTrace, a unique toolchain for automating the vertical reuse of PMs, developed by extending and adapting existing open-source tools and by developing custom tools. The toolchain was evaluated on several open-source RTL designs of varying complexity. Results demonstrate that the toolchain scales effectively with design complexity and transforms PSS vertical reuse from a manual, error-prone process into an automated approach grounded in static design analysis.

Keywords

PSS, Digital Design, Static Analysis, Data Flow, Control Flow, SMT, SystemVerilog, Simulation-based Verification

URL
Published
2025
Pages
1–4
Proceedings
2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Conference
32nd IEEE International Conference on Electronics, Circuits and Systems
ISBN
979-8-3315-9585-2
Publisher
IEEE
Place
Marrakech, Morocco
DOI
EID Scopus
BibTeX
@inproceedings{BUT198105,
  author="Petr {Bardonek} and Marcela {Zachariášová}",
  title="VerTrace: An Open-Source Toolchain for Portable Stimulus Vertical Reuse",
  booktitle="2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)",
  year="2025",
  pages="1--4",
  publisher="IEEE",
  address="Marrakech, Morocco",
  doi="10.1109/ICECS66544.2025.11270614",
  isbn="979-8-3315-9585-2",
  url="https://ieeexplore.ieee.org/document/11270614"
}
Projects
Application-specific HW/SW architectures and their applications, BUT, Vnitřní projekty VUT, FIT-S-23-8141, start: 2023-03-01, end: 2026-02-28, completed
Departments
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