Publication Details

Design, Verification, Test and In-Field Implications of Approximate Computing Systems

BOSIO Alberto, DI Carlo Stefano, GIRARD Patrick, SANCHEZ Ernesto, SAVINO Aessandro, SEKANINA Lukáš, TRAIOLA Marcello, VAŠÍČEK Zdeněk and VIRAZEL Arnaud. Design, Verification, Test and In-Field Implications of Approximate Computing Systems. In: 25th IEEE European Test Symposium. Los Alamitos: Institute of Electrical and Electronics Engineers, 2020, pp. 1-10. ISBN 978-1-7281-4312-5. Available from: https://ieeexplore.ieee.org/document/9131557
Czech title
Návrh, verifikace, testování a dopady nasazování aproximativních počítačových systémů
Type
conference paper
Language
english
Authors
Bosio Alberto (LIRMM)
Di Carlo Stefano (POLITO)
Girard Patrick (LIRMM)
Sanchez Ernesto (POLITO)
Savino Aessandro (POLITO)
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY FIT BUT)
Traiola Marcello (LIRMM)
Vašíček Zdeněk, doc. Ing., Ph.D. (DCSY FIT BUT)
Virazel Arnaud (LIRMM)
URL
Keywords

approximate computing, circuit, design, test

Abstract

Today, the concept of approximation in computing is becoming more and more a "hot topic" to investigate how computing systems can be more energy efficient, faster, and less complex. Intuitively, instead of performing exact computations and, consequently, requiring a high amount of resources, Approximate Computing aims at selectively relaxing the specifications, trading accuracy off for efficiency. While Approximate Computing gives several promises when looking at systems' performance, energy efficiency and complexity, it poses significant challenges regarding the design, the verification, the test and the in-field reliability of Approximate Computing systems. This tutorial paper covers these aspects leveraging the experience of the authors in the field to present state-of-the-art solutions to apply during the different development phases of an Approximate Computing system.

Published
2020
Pages
1-10
Proceedings
25th IEEE European Test Symposium
Conference
IEEE European Test Symposium, Tallinn, EE
ISBN
978-1-7281-4312-5
Publisher
Institute of Electrical and Electronics Engineers
Place
Los Alamitos, US
DOI
10.1109/ETS48528.2020.9131557
UT WoS
000615974000003
EID Scopus
2-s2.0-85089145901
BibTeX 
@INPROCEEDINGS{FITPUB12228,
   author = "Alberto Bosio and Stefano Carlo Di and Patrick Girard and Ernesto Sanchez and Aessandro Savino and Luk\'{a}\v{s} Sekanina and Marcello Traiola and Zden\v{e}k Va\v{s}\'{i}\v{c}ek and Arnaud Virazel",
   title = "Design, Verification, Test and In-Field Implications of Approximate Computing Systems",
   pages = "1--10",
   booktitle = "25th IEEE European Test Symposium",
   year = 2020,
   location = "Los Alamitos, US",
   publisher = "Institute of Electrical and Electronics Engineers",
   ISBN = "978-1-7281-4312-5",
   doi = "10.1109/ETS48528.2020.9131557",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/12228"
}
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