Result Details
Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers
        SEKANINA, L.; RŮŽIČKA, R. Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers. The 2003 NASA/DoD Conference on Evolvable Hardware. Los Alamitos: IEEE Computer Society Press, 2003. p. 135-144.  ISBN: 0-7695-1977-6.
    
                Type
            
        
                conference paper
            
        
                Language
            
        
                English
            
        
            Authors
            
        
                    Abstract
            
        The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved salt and pepper noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.
                Keywords
            
        digital circuit, evolvable hardware, testability, image operator
                URL
            
        
                Published
            
            
                    2003
                    
                
            
                    Pages
                
            
                        135–144
                
            
                        Proceedings
                
            
                    The 2003 NASA/DoD Conference on Evolvable Hardware
                
            
                    Conference
                
            
                    The 2003 NASA/DoD Conference on Evolvable Hardware
                
            
                    ISBN
                
            
                    0-7695-1977-6
                
            
                    Publisher
                
            
                    IEEE Computer Society Press
                
            
                    Place
                
            
                    Los Alamitos
                
            
                    BibTeX
                
            @inproceedings{BUT13980,
  author="Lukáš {Sekanina} and Richard {Růžička}",
  title="Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers",
  booktitle="The 2003 NASA/DoD Conference on Evolvable Hardware",
  year="2003",
  pages="135--144",
  publisher="IEEE Computer Society Press",
  address="Los Alamitos",
  isbn="0-7695-1977-6",
  url="https://www.fit.vut.cz/research/publication/7186/"
}
                Projects
            
        
        
            
        
    
    
        Evolvable hardware based applications design methods, GACR, Postdoktorandské granty, GP102/03/P004, start: 2003-01-01, end: 2005-12-31, completed
                
Formal approach to digital circuits test scheduling, GACR, Postdoktorandské granty, GP102/03/P176, start: 2003-01-01, end: 2005-12-31, completed
Formal Approaches in Digital Design Diagnostics - Testable Design Verification, GACR, Standardní projekty, GA102/01/1531, start: 2001-01-01, end: 2003-12-31, completed
        Formal approach to digital circuits test scheduling, GACR, Postdoktorandské granty, GP102/03/P176, start: 2003-01-01, end: 2005-12-31, completed
Formal Approaches in Digital Design Diagnostics - Testable Design Verification, GACR, Standardní projekty, GA102/01/1531, start: 2001-01-01, end: 2003-12-31, completed
                Research groups
            
        
                Evolvable Hardware Research Group (RG EHW)
            
        
                Departments