Publication Details

Formal Approach to Synthesis of a Test Controller

RŮŽIČKA Richard and TUPEC Pavel. Formal Approach to Synthesis of a Test Controller. In: Proceedings of Eleventh International Conference and Workshop on the Engineering of Computer-Based Systems. Los Alamitos, California: IEEE Computer Society, 2004, pp. 348-355. ISBN 0-7695-2125-8.
Czech title
Formální přístup k syntéze řadiče testu
Type
conference paper
Language
english
Authors
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY FIT BUT)
Tupec Pavel, Ing. (DCSY FIT BUT)
Keywords

Testability, Test Controller, Automata, I path

Abstract

In the paper, a method for formal construction of a test controller of the RT level digital circuit is presented. As input, a digital circuit structure at RT level designed using any DfT technique is assumed. The proposed method enables to create a Finite State Machine with output, which can control all enable, address and clock inputs of circuit elements during the test application process. It is assumed that test patterns are inserted to circuit primary input ports and transferred through the circuit structure to selected points inside the circuit, to which they must be applied. Responses to these test patterns must then be transferred outside of the circuit and analyzed. Transfers of such diagnostic data are controlled by the test controller. Formal tools and approaches are used. The main advantage of formally described methods is that all processes are easily provable and no large evaluation of proposed methods on benchmark circuits is necessary.

Published
2004
Pages
348-355
Proceedings
Proceedings of Eleventh International Conference and Workshop on the Engineering of Computer-Based Systems
Conference
Eleventh IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems, Brno, CZ
ISBN
0-7695-2125-8
Publisher
IEEE Computer Society
Place
Los Alamitos, California, US
BibTeX
@INPROCEEDINGS{FITPUB7480,
   author = "Richard R\r{u}\v{z}i\v{c}ka and Pavel Tupec",
   title = "Formal Approach to Synthesis of a Test Controller",
   pages = "348--355",
   booktitle = "Proceedings of Eleventh International Conference and Workshop on the Engineering of Computer-Based Systems",
   year = 2004,
   location = "Los Alamitos, California, US",
   publisher = "IEEE Computer Society",
   ISBN = "0-7695-2125-8",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7480"
}
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