Thesis Details

Zobrazování map kvality křemíkových plátů v reálném čase

Bachelor's Thesis Student: Mareček Matěj Academic Year: 2012/2013 Supervisor: Herout Adam, prof. Ing., Ph.D.
English title
Real-Time Displaying Quality Maps of Silicon Wafers

The goal of this bachelor's thesis is to design and implement a software system that can collect real-time data from measurements of silicon wafers. There could be tens or hundreds data sources of measurements and data from these measurements can be rendered (also in real time). This work contains a description of the process of manufacturing and testing of integrated circuits. Subsequently, there is description of system architecture design, interior architecture of real-time server and GUI of client application. In the last section, there is shown how rendering of silicon wafers was implemented on platform JavaFX 2.2 and also implementation of hybrid multi-threading server architecture.


Silicon wafers, real-time displaying, JavaFX 2.2, graphical user interface, server, parallelism

Degree Programme
defended, grade A
11 June 2013
Černocký Jan, prof. Dr. Ing. (DCGM FIT BUT), předseda
Beran Vítězslav, Ing., Ph.D. (DCGM FIT BUT), člen
Holík Lukáš, doc. Mgr., Ph.D. (DITS FIT BUT), člen
Kreslíková Jitka, doc. RNDr., CSc. (DIFS FIT BUT), člen
Strnadel Josef, Ing., Ph.D. (DCSY FIT BUT), člen
MAREČEK, Matěj. Zobrazování map kvality křemíkových plátů v reálném čase. Brno, 2013. Bachelor's Thesis. Brno University of Technology, Faculty of Information Technology. 2013-06-11. Supervised by Herout Adam. Available from:
    author = "Mat\v{e}j Mare\v{c}ek",
    type = "Bachelor's thesis",
    title = "Zobrazov\'{a}n\'{i} map kvality k\v{r}em\'{i}kov\'{y}ch pl\'{a}t\r{u} v re\'{a}ln\'{e}m \v{c}ase",
    school = "Brno University of Technology, Faculty of Information Technology",
    year = 2013,
    location = "Brno, CZ",
    language = "czech",
    url = ""
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