Faculty of Information Technology, BUT

Publication Details

On the Automatic Design of Testable Circuits

SEKANINA Lukáš and RŮŽIČKA Richard. On the Automatic Design of Testable Circuits. In: Proceedings of IEEE Workshop on Design nad Diagnostics of Electronic Circuits and Systems. Poznań: Publishing House of Poznan University of Technology, 2003, pp. 299-300. ISBN 83-7143-557-6.
Czech title
Příspěvek k automatizovanému návrhu testovatelných obvodů
Type
conference paper
Language
english
Authors
Keywords
Evolutionary design, testability, digital circuits
Abstract
An approach to the design of non-trivial circuits that are competitive with conventional designs in terms of quality as well as implementation cost, and furthermore, which are easily testable, is introduced in this paper.
Annotation
An approach to the design of non-trivial circuits that are competitive with conventional designs in terms of quality as well as implementation cost, and furthermore, which are easily testable, is introduced in this paper.
Published
2003
Pages
299-300
Proceedings
Proceedings of IEEE Workshop on Design nad Diagnostics of Electronic Circuits and Systems
Conference
6th IEEE International Workshop On DDECS, Poznaň, hotel Trawinski, PL
ISBN
83-7143-557-6
Publisher
Publishing House of Poznan University of Technology
Place
Poznań, PL
BibTeX
@INPROCEEDINGS{FITPUB7162,
   author = "Luk\'{a}\v{s} Sekanina and Richard R\r{u}\v{z}i\v{c}ka",
   title = "On the Automatic Design of Testable Circuits",
   pages = "299--300",
   booktitle = "Proceedings of IEEE Workshop on Design nad Diagnostics of Electronic Circuits and Systems",
   year = 2003,
   location = "Pozna\'{n}, PL",
   publisher = "Publishing House of Poznan University of Technology",
   ISBN = "83-7143-557-6",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7162"
}
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