Result Details
The Test Controller Design Based on I-Path Concept
MIKA, D. The Test Controller Design Based on I-Path Concept. Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3. Brno: Faculty of Electrical Engineering and Communication BUT, 2003. p. 624-628. ISBN: 80-214-2379-X.
Type
conference paper
Language
English
Authors
Mika Daniel, Ing., Ph.D.
Abstract
In the paper the process of the test controller design and synthesis onregister transfer level is described. The principle of circuit elementaccess is discussed during the test plan scheduling. The formal tool -a mathematical logic and a set theory - is used as suitable tool fortest controller design process. The problem of I-path is explained anda simple example of I-path is also demonstrated.
Keywords
Register Transfer Level, I-path, I-mode, Circuit Under Test
Published
2003
Pages
624–628
Proceedings
Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3
Conference
Student EEICT 2003
ISBN
80-214-2379-X
Publisher
Faculty of Electrical Engineering and Communication BUT
Place
Brno
BibTeX
@inproceedings{BUT13963,
author="Daniel {Mika}",
title="The Test Controller Design Based on I-Path Concept",
booktitle="Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3",
year="2003",
pages="624--628",
publisher="Faculty of Electrical Engineering and Communication BUT",
address="Brno",
isbn="80-214-2379-X"
}
Research groups
Departments