Detail výsledku

The Test Controller Design Based on I-Path Concept

MIKA, D. The Test Controller Design Based on I-Path Concept. Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3. Brno: Faculty of Electrical Engineering and Communication BUT, 2003. p. 624-628. ISBN: 80-214-2379-X.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Mika Daniel, Ing., Ph.D., FIT (FIT)
Abstrakt

In the paper the process of the test controller design and synthesis onregister transfer level is described. The principle of circuit elementaccess is discussed during the test plan scheduling. The formal tool -a mathematical logic and a set theory - is used as suitable tool fortest controller design process. The problem of I-path is explained anda simple example of I-path is also demonstrated.

Klíčová slova

Register Transfer Level, I-path, I-mode, Circuit Under Test

Rok
2003
Strany
624–628
Sborník
Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3
Konference
Student EEICT 2003
ISBN
80-214-2379-X
Vydavatel
Faculty of Electrical Engineering and Communication BUT
Místo
Brno
BibTeX 
@inproceedings{BUT13963,
  author="Daniel {Mika}",
  title="The Test Controller Design Based on I-Path Concept",
  booktitle="Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3",
  year="2003",
  pages="624--628",
  publisher="Faculty of Electrical Engineering and Communication BUT",
  address="Brno",
  isbn="80-214-2379-X"
}
Výzkumné skupiny
Výzkumná skupina Superpočítačových technologií SC@FIT (VZ SC@FIT)
Pracoviště
Ústav počítačových systémů (UPSY)
Nahoru