Result Details
On Distribution of Testability Values in Scan-Layout State-Space
STRNADEL, J. On Distribution of Testability Values in Scan-Layout State-Space. Proceedings of the 7th International Scientific Conference on Electronic Computers and Informatics. Košice: The University of Technology Košice, 2006. p. 308-313. ISBN: 80-8073-598-0.
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D., DCSY (FIT)
Abstract
In the paper, it is shown how are testability values distributed within the scan-layout state-space for particular digital circuit. The goal of the paper was to approve or dismiss our hypothesis that the more registers are included in greater number of multiple scan-chains within particular scan-layout,
the better testability properties correspond to the scan-layout.
Keywords
digital circuit diagnostics, register-transfer level, circuit data-path, testability analysis, design for testability, testability improvements, scan technique
Published
2006
Pages
308–313
Proceedings
Proceedings of the 7th International Scientific Conference on Electronic Computers and Informatics
Conference
7TH International Scientific Conference Electronic Computers and Informatics 2006
ISBN
80-8073-598-0
Publisher
The University of Technology Košice
Place
Košice
BibTeX
@inproceedings{BUT22271,
author="Josef {Strnadel}",
title="On Distribution of Testability Values in Scan-Layout State-Space",
booktitle="Proceedings of the 7th International Scientific Conference on Electronic Computers and Informatics",
year="2006",
pages="308--313",
publisher="The University of Technology Košice",
address="Košice",
isbn="80-8073-598-0",
url="https://www.fit.vut.cz/research/publication/8181/"
}
Files
Projects
Modern Methods of Digital Systems Design, GACR, Standardní projekty, GA102/04/0737, start: 2004-01-01, end: 2006-12-31, completed
Optimizing Methods in Digital Systems Diagnosis, GACR, Postdoktorandské granty, GP102/05/P193, start: 2005-01-01, end: 2007-12-31, completed
Optimizing Methods in Digital Systems Diagnosis, GACR, Postdoktorandské granty, GP102/05/P193, start: 2005-01-01, end: 2007-12-31, completed
Research groups
Dependable Digital Systems Research Group (RG DEPSYS)
Departments