Result Details
Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis
        STRNADEL, J. Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis. Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002. Edition 55. Košice: The University of Technology Košice, 2002. p. 200-205.  ISBN: 80-7099-879-2.
    
                Type
            
        
                conference paper
            
        
                Language
            
        
                English
            
        
            Authors
            
        
                Strnadel Josef, Ing., Ph.D., FIT (FIT)
            
        
                    Abstract
            
        The paper presents measures for testability valuation of a digital circuit at register-transfer level (RT level, RTL). Definition of a graph model of a RTL digital circuit for these purposes and mathematical formulas of measures for testability valuation based on analysis of proposed graph model are presented in this paper. Finally, experimental results are presented.
                Keywords
            
        Register transfer level, digital circuit graph model, testability analysis measures
                Published
            
            
                    2002
                    
                
            
                    Pages
                
            
                        200–205
                
            
                        Proceedings
                
            
                    Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002
                
            
                    Series
                
            
                    Edition 55
                
            
                    Conference
                
            
                    Electronic Computers and Informatics'2002
                
            
                    ISBN
                
            
                    80-7099-879-2
                
            
                    Publisher
                
            
                    The University of Technology Košice
                
            
                    Place
                
            
                    Košice
                
            
                    BibTeX
                
            @inproceedings{BUT10247,
  author="Josef {Strnadel}",
  title="Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis",
  booktitle="Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002",
  year="2002",
  series="Edition 55",
  pages="200--205",
  publisher="The University of Technology Košice",
  address="Košice",
  isbn="80-7099-879-2",
  url="https://www.fit.vut.cz/research/publication/6995/"
}
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