Detail výsledku
Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis
STRNADEL, J. Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis. Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002. Edition 55. Košice: The University of Technology Košice, 2002. p. 200-205. ISBN: 80-7099-879-2.
Typ
článek ve sborníku konference
Jazyk
anglicky
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Abstrakt
The paper presents measures for testability valuation of a digital circuit at register-transfer level (RT level, RTL). Definition of a graph model of a RTL digital circuit for these purposes and mathematical formulas of measures for testability valuation based on analysis of proposed graph model are presented in this paper. Finally, experimental results are presented.
Klíčová slova
Register transfer level, digital circuit graph model, testability analysis measures
Rok
2002
Strany
200–205
Sborník
Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002
Řada
Edition 55
Konference
Electronic Computers and Informatics'2002
ISBN
80-7099-879-2
Vydavatel
The University of Technology Košice
Místo
Košice
BibTeX
@inproceedings{BUT10247,
author="Josef {Strnadel}",
title="Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis",
booktitle="Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002",
year="2002",
series="Edition 55",
pages="200--205",
publisher="The University of Technology Košice",
address="Košice",
isbn="80-7099-879-2",
url="https://www.fit.vut.cz/research/publication/6995/"
}
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