Result Details
In-Vehicle Channel Measurement, Characterization and Spatial Consistency Comparison of 3-11 GHz and 55-65 GHz Frequency Bands
Prokeš Aleš, prof. Ing., Ph.D., UREL (FEEC)
Chandra Aniruddha, Dr., Ph.D., UREL (FEEC)
Mikulášek Tomáš, Ing., Ph.D., UREL (FEEC)
Maršálek Roman, prof. Ing., Ph.D., UREL (FEEC)
Zemen Thomas, Priv.-Doz. Dr.techn
Mecklenbräuker Christoph, Prof. Ing. Dipl.-Ing. Dr.-Ing., UREL (FEEC)
The paper provides real-word wireless measurement data of the intra-vehicular channel for both the 3-11 GHz and the 55-65 GHz frequency band under similar conditions. By spatially averaging channel impulse response (CIR) realizations within a 10×10 grid, we obtain the power-delay profile (PDP). The data measured at 3-11 GHz and 55-65 GHz exhibit significant differences in terms of root mean square (RMS) delay spread, number of resolvable clusters and variance of the maximal excess delay. Moreover, we evaluate the spatial stationarity via the Pearson correlation coefficient and via the PDP collinearity depending on the distance in the grid. The measured and calculated results indicate that a strong reverberation inside the vehicle produces similar PDPs within the range of approximately 10 wavelengths. We also provide a linear piecewise model of the PDP in logarithmic scale and a generalized extreme value (GEV) model of small-scale signal fading. Our channel model is validated utilizing the Kolmogorov-Smirnov (K-S) test.
In-vehicle channel model; PDP; UWB; channel stationarity; frequency domain channel sounding; mm-wave
@article{BUT127332,
author="Jiří {Blumenstein} and Aleš {Prokeš} and Aniruddha {Chandra} and Tomáš {Mikulášek} and Roman {Maršálek} and Thomas {Zemen} and Christoph {Mecklenbräuker}",
title="In-Vehicle Channel Measurement, Characterization and Spatial Consistency Comparison of 3-11 GHz and 55-65 GHz Frequency Bands",
journal="IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY",
year="2016",
volume="PP",
number="99",
pages="1--13",
doi="10.1109/TVT.2016.2600101",
issn="0018-9545",
url="http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7542517"
}