Result Details
LTE and DVB-T2 Networks in the First Digital Dividend Band in Europe: A Coexistence Study
Miloš Jiří, Ing., Ph.D., UREL (FEEC)
Kresta Daniel, Ing.
Kratochvíl Tomáš, prof. Ing., Ph.D., UREL (FEEC)
Maršálek Roman, prof. Ing., Ph.D., UREL (FEEC)
Study of possible coexistence scenarios between the Long Term Evolution (LTE) and the first/second generation
digital video broadcasting terrestrial (DVB-T/T2) networks is still receiving a lot of attention. This is mainly caused by the first and second digital dividend bands (700MHz and 800MHz) in which a dominant part of UHF spectrum has been released for LTE mobile broadband communication. Studies in this field dominantly focus on the evaluation of the DVB-T2 system performance affected by LTE with different channel bandwidths.
Hence, the main aim of this paper is to explore robustness of the LTE-Downlink (LTE-DL) system influenced by DVB-T2 system designed for fixed TV reception. In particular, different traffic loads, signal bandwidths, M-QAM modulations and possible in-phase/quadrature (IQ) errors are considered which have a direct impact on the robustness of the LTE-DL system. The results from laboratory measurements are evaluated by the error vector magnitude (EVM) and carrier-to-interference ratio (C/I) objective parameters. The main outputs of this research
article enable to reveal performance of different LTE-DL system configurations in the 800MHz band. Moreover, these outputs are exploitable for providers of mobile services to optimize network configurations in the future.
LTE, DVB-T2, RF spectrum, coexistence, interference, IQ-errors, RF measurement, EVM, C/I
@inproceedings{BUT147070,
author="Ladislav {Polák} and Jiří {Miloš} and Daniel {Kresta} and Tomáš {Kratochvíl} and Roman {Maršálek}",
title="LTE and DVB-T2 Networks in the First Digital Dividend Band in Europe: A Coexistence Study",
booktitle="Proceeding of 28th International Conference Radioelektronika",
year="2018",
volume="1",
number="1",
pages="1--4",
doi="10.1109/RADIOELEK.2018.8376386",
isbn="978-1-5386-2485-2",
url="https://ieeexplore.ieee.org/document/8376386/"
}