Result Details

OTFS Modulation and Influence of Wideband RF Impairments Measured on a 60 GHz Testbed

MARŠÁLEK, R.; BLUMENSTEIN, J.; POSPÍŠIL, M.; SCHUTZENHOFER, D. OTFS Modulation and Influence of Wideband RF Impairments Measured on a 60 GHz Testbed. In Proceedings of 2020 IEEE 21st International Workshop on Signal Processing Advances in Wireless Communications (SPAWC). New York: IEEE, 2020. p. 1-5. ISBN: 978-1-7281-5478-7.
Type
conference paper
Language
English
Authors
Maršálek Roman, prof. Ing., Ph.D., REL-SIX (FEEC), UREL (FEEC)
Blumenstein Jiří, doc. Ing., Ph.D., UREL (FEEC)
Schutzenhofer Daniel
Pospíšil Martin, Ing., Ph.D., UREL (FEEC)
Abstract

Orthogonal Time Frequency Space (OTFS) modulation has recently been proposed for communication in doubly selective channels. Together with millimeter waves, OTFS seems to be one of the promising candidates for beyond-5G communication systems. In this paper we present the performance of an OTFS system with an Linear Minimum Mean Square Error (LMMSE) equalizer in the presence of main hardware impairments extracted from our millimeter-wave setup in the 60 GHz band.

Keywords

OTFS; millimeter waves; RF impairments

URL
Published
2020
Pages
1–5
Proceedings
Proceedings of 2020 IEEE 21st International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)
Conference
2020 IEEE 21st International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)
ISBN
978-1-7281-5478-7
Publisher
IEEE
Place
New York
DOI
UT WoS
000620337500055
EID Scopus
BibTeX
@inproceedings{BUT165913,
  author="Roman {Maršálek} and Jiří {Blumenstein} and Daniel {Schutzenhofer} and Martin {Pospíšil}",
  title="OTFS Modulation and Influence of Wideband RF Impairments Measured on a 60 GHz Testbed",
  booktitle="Proceedings of 2020 IEEE 21st International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)",
  year="2020",
  pages="1--5",
  publisher="IEEE",
  address="New York",
  doi="10.1109/SPAWC48557.2020.9154257",
  isbn="978-1-7281-5478-7",
  url="https://ieeexplore.ieee.org/document/9154257"
}
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