Result Details

Random Test Generation Through a Probabilistic Constrained Grammar

ČEKAN, O.; KOTÁSEK, Z. Random Test Generation Through a Probabilistic Constrained Grammar. INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Budapešť: 2018. p. 5-8.
Type
conference paper
Language
English
Authors
Čekan Ondřej, Ing., Ph.D., DCSY (FIT)
Kotásek Zdeněk, doc. Ing., CSc., DCSY (FIT), UTKO (FEEC)
Abstract

The paper introduces a probabilistic constrained grammar which is a newly formed grammar system for the use in the area of test stimuli generation. The grammar extends the existing probabilistic context-free grammar and establishes constraints for the grammar limitations. Stimuli obtained through the proposed principle are used in functional verification of a RISC processor and the coverage metric is evaluated. The paper also contains examples of how to define a problem of assembly code generation for processors.

Published
2018
Pages
5–8
Proceedings
INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Conference
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2018
Place
Budapešť
BibTeX 
@inproceedings{BUT168460,
  author="Ondřej {Čekan} and Zdeněk {Kotásek}",
  title="Random Test Generation Through a Probabilistic Constrained Grammar",
  booktitle="INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2018",
  pages="5--8",
  address="Budapešť"
}
Projects
IT4Innovations excellence in science, MŠMT, Národní program udržitelnosti II, LQ1602, start: 2016-01-01, end: 2020-12-31, completed
Pokročilé paralelní a vestavěné počítačové systémy, BUT, Vnitřní projekty VUT, FIT-S-17-3994, start: 2017-03-01, end: 2020-02-29, completed
Research groups
Dependable Digital Systems Research Group (RG DEPSYS)
Departments
Department of Computer Systems (DCSY)
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