Result Details

Practical Training for Development and Programming of Embedded Systems

FRÝZA, T. Practical Training for Development and Programming of Embedded Systems. In Proceedings - Research Monograph of 2022 11th Mediterranean Conference on Embedded Computing (MECO). Institute of Electrical and Electronics Engineers Inc., 2022. p. 668-671. ISBN: 978-1-6654-6828-2.
Type
conference paper
Language
English
Authors
Frýza Tomáš, doc. Ing., Ph.D., REL-SIX (FEEC), UREL (FEEC)
Abstract

The paper presents the possibility of creating and programming embedded systems in C and assembly in a~bachelor's course for university students. The aim of the teaching activities is not only to acquaint students with the structure and possibilities of embedded systems, but above all to attract students outside the university, within their private hobby projects. For this reason, the paper describes available tools, at no cost, for all major development platforms. Curricula, materials, tutorials, demonstrations and libraries in C were designed and made available to the general public in the GitHub repository.

Keywords

Education, embedded systems, AVR, Arduino, C code, assembly language

URL
Published
2022
Pages
668–671
Proceedings
Proceedings - Research Monograph of 2022 11th Mediterranean Conference on Embedded Computing (MECO)
Conference
2022 11th Mediterranean Conference on Embedded Computing (MECO)
2024 13th Mediterranean Conference on Embedded Computing (MECO)
ISBN
978-1-6654-6828-2
Publisher
Institute of Electrical and Electronics Engineers Inc.
DOI
UT WoS
000855969800134
EID Scopus
BibTeX
@inproceedings{BUT178167,
  author="Tomáš {Frýza}",
  title="Practical Training for Development and Programming of Embedded Systems",
  booktitle="Proceedings - Research Monograph of 2022 11th Mediterranean Conference on Embedded Computing (MECO)",
  year="2022",
  pages="668--671",
  publisher="Institute of Electrical and Electronics Engineers Inc.",
  doi="10.1109/MECO55406.2022.9797100",
  isbn="978-1-6654-6828-2",
  url="https://ieeexplore.ieee.org/abstract/document/9797100"
}
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