Result Details

Facial Image Reconstruction and its Influence to Face Recognition

PLEŠKO, F.; GOLDMANN, T.; MALINKA, K. Facial Image Reconstruction and its Influence to Face Recognition. 2023 International Conference of the Biometrics Special Interest Group (BIOSIG). Darmstadt: Society for Informatics, 2023. p. 1-4. ISBN: 979-8-3503-3655-9.
Type
conference paper
Language
English
Authors
Pleško Filip, Ing.
Goldmann Tomáš, Ing., Ph.D., DITS (FIT)
Malinka Kamil, doc. Mgr., Ph.D., DITS (FIT)
Abstract

This paper focuses on reconstructing damaged facial images using GAN neural networks. In addition, the effect of generating the missing part of the face on face recognition is investigated. The main objective of this work is to observe whether it is possible to increase the accuracy of face recognition by generating missing parts while maintaining a low false accept rate (FAR). A new model for generating the missing parts of a face has been proposed. For face-based recognition, state-of-the-art solutions from the DeepFace library and the QMagFace solution have been used.

Keywords

face recognition, neural network, face reconstruction, generativní adversariální síť, SFace, ArcFace, QMagFace

URL
Published
2023
Pages
1–4
Proceedings
2023 International Conference of the Biometrics Special Interest Group (BIOSIG)
Conference
22nd International Conference of the Biometrics Special Interest Group
ISBN
979-8-3503-3655-9
Publisher
Society for Informatics
Place
Darmstadt
DOI
10.1109/BIOSIG58226.2023
BibTeX 
@inproceedings{BUT186943,
  author="Filip {Pleško} and Tomáš {Goldmann} and Kamil {Malinka}",
  title="Facial Image Reconstruction and its Influence to Face Recognition",
  booktitle="2023 International Conference of the Biometrics Special Interest Group (BIOSIG)",
  year="2023",
  pages="1--4",
  publisher="Society for Informatics",
  address="Darmstadt",
  doi="10.1109/BIOSIG58226.2023",
  isbn="979-8-3503-3655-9",
  url="https://ieeexplore.ieee.org/document/10346000"
}
Projects
Reliable, Secure, and Intelligent Computer Systems, BUT, Vnitřní projekty VUT, FIT-S-23-8151, start: 2023-03-01, end: 2026-02-28, running
Research groups
Security Technology Research and Development (RG STRaDe)
Departments
Department of Intelligent Systems (DITS)
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