Result Details
Data Dependent I Path and their Utilisation in DFT
This paper describes an algorithm for utilisation of data paths in the digital circuit, in what functional units occur. These paths, called i paths, are used to transport test patterns and responses to them during the test of the circuit. Some functional units have an identity mode conditioned by the presence of concrete data (e.g. zero for an adder) on their inputs. When these dependencies are taken into account, the cost of modifications for testability of the circuit can be significantly reduced.
i path, design-for-testability, i mode, data dependent i mode
This paper describes an algorithm for utilisation of data paths in the digital circuit, in what functional units occur. These paths, called i paths, are used to transport test patterns and responses to them during the test of the circuit. Some functional units have an identity mode conditioned by the presence of concrete data (e.g. zero for an adder) on their inputs. When these dependencies are taken into account, the cost of modifications for testability of the circuit can be significantly reduced.
@inproceedings{BUT191625,
author="Richard {Růžička}",
title="Data Dependent I Path and their Utilisation in DFT",
booktitle="Sborník prací studentů a doktorandů FEI VUT",
year="2000",
pages="228--230",
publisher="Akademické nakladatelství CERM",
address="Brno",
isbn="80-7204-155-X"
}