Publication Details

28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

BOSIO, A.; BERNARDI, P.; TRAIOLA, M.; MRÁZEK, V. 28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Lyon: Institute of Electrical and Electronics Engineers, 2025. ISBN: 979-8-3315-2801-0.

Czech title

28. mezinárodní sympozium o návrhu a diagnostice elektronických obvodů a systémů

Type

conference proceedings

Language

English

Authors

BOSIO, A.
BERNARDI, P.
TRAIOLA, M.
Mrázek Vojtěch, Ing., Ph.D. (DCSY)

Keywords

electronic circuit, design, test, design method, digital circuit, analog circuit

Abstract

This proceedings contains reviewed papers accepted for publication and presentation at the 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2025). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Published

2025 (in print)

Pages

166

Conference

International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Lyon, FR

ISBN

979-8-3315-2801-0

Publisher

Institute of Electrical and Electronics Engineers

Place

Lyon

BibTeX

@proceedings{BUT197714,
  editor="BOSIO, A. and BERNARDI, P. and TRAIOLA, M. and MRÁZEK, V.",
  title="28th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2025",
  pages="166",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Lyon",
  isbn="979-8-3315-2801-0"
}