Result Details

A New Laboratory Workplace for Testing of ADCs

HÁZE, J.; VRBA, R.; BAJER, A. A New Laboratory Workplace for Testing of ADCs. In Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2005. Brno: IMAPS CS, 2005. 3 p. ISBN: 80-214-2990-9.
Type
conference paper
Language
English
Authors
Háze Jiří, doc. Ing., Ph.D., UMEL (FEEC)
Vrba Radimír, prof. Ing., CSc., UMEL (FEEC)
Bajer Arnošt, doc. Ing., CSc., UMEL (FEEC)
Abstract

The paper describes a new laboratory workplace, which is used to measure basic properties of various ADCs. It contains of personal computer with measuring card, testing devices and samples. The testing process is controlled via software, which was also programmed. The workplace will be utilized in education of several subjects coupled to design of integrated circuits mostly ADCs.

Keywords

Education, testing of ADCs

Published
2005
Pages
3
Proceedings
Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2005
Conference
Electronic Devices and Systems IMAPS CS International Conference 2005, 15. - 16. 9. 2005
ISBN
80-214-2990-9
Publisher
IMAPS CS
Place
Brno
BibTeX 
@inproceedings{BUT15264,
  author="Jiří {Háze} and Radimír {Vrba} and Arnošt {Bajer}",
  title="A New Laboratory Workplace for Testing of ADCs",
  booktitle="Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2005",
  year="2005",
  pages="3",
  publisher="IMAPS CS",
  address="Brno",
  isbn="80-214-2990-9"
}
Departments
Department of Microelectronics (UMEL)
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