Detail výsledku

A New Laboratory Workplace for Testing of ADCs

HÁZE, J.; VRBA, R.; BAJER, A. A New Laboratory Workplace for Testing of ADCs. In Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2005. Brno: IMAPS CS, 2005. 3 p. ISBN: 80-214-2990-9.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Háze Jiří, doc. Ing., Ph.D., UMEL (FEKT)
Vrba Radimír, prof. Ing., CSc., UMEL (FEKT)
Bajer Arnošt, doc. Ing., CSc., UMEL (FEKT)
Abstrakt

The paper describes a new laboratory workplace, which is used to measure basic properties of various ADCs. It contains of personal computer with measuring card, testing devices and samples. The testing process is controlled via software, which was also programmed. The workplace will be utilized in education of several subjects coupled to design of integrated circuits mostly ADCs.

Klíčová slova

Education, testing of ADCs

Rok
2005
Strany
3
Sborník
Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2005
Konference
Electronic Devices and Systems IMAPS CS International Conference 2005, 15. - 16. 9. 2005
ISBN
80-214-2990-9
Vydavatel
IMAPS CS
Místo
Brno
BibTeX 
@inproceedings{BUT15264,
  author="Jiří {Háze} and Radimír {Vrba} and Arnošt {Bajer}",
  title="A New Laboratory Workplace for Testing of ADCs",
  booktitle="Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2005",
  year="2005",
  pages="3",
  publisher="IMAPS CS",
  address="Brno",
  isbn="80-214-2990-9"
}
Pracoviště
Ústav mikroelektroniky (UMEL)
Nahoru