Result Details

A Complex Approach to Digital RTL Circuit Testability - iFCoRT System

RŮŽIČKA, R. A Complex Approach to Digital RTL Circuit Testability - iFCoRT System. Informal Digest of Papers of the IEEE European Test Symposium 2005. Tallinn: Tallinn University of Technology, 2005. p. 156-157.
Type
conference paper
Language
English
Authors
Růžička Richard, doc. Ing., Ph.D., MBA, DCSY (FIT)
Abstract

In the paper, a complex approach to the RT level digital circuit diagnostics is presented. This system we call iFCoRT - I path Based, Formally Described and Proved Concept of RTL Digital Circuits Testability. The approach is based on the I path concept and employs Design-for-Testability principles such as Partial Scan etc. Presented approach includes the model of the circuit, testability analysis, testability verification, test scheduling and test controller synthesis. All modules of the system are formally specified and then are, step-by-step, formally proved their correctness.

Keywords

RT level diagnostics, i paths, design-for-testability

Published
2005
Pages
156–157
Proceedings
Informal Digest of Papers of the IEEE European Test Symposium 2005
Conference
10th IEEE European Test Symposium 2005
Publisher
Tallinn University of Technology
Place
Tallinn
BibTeX 
@inproceedings{BUT21509,
  author="Richard {Růžička}",
  title="A Complex Approach to Digital RTL Circuit Testability - iFCoRT System",
  booktitle="Informal Digest of Papers of the IEEE European Test Symposium 2005",
  year="2005",
  pages="156--157",
  publisher="Tallinn University of Technology",
  address="Tallinn"
}
Projects
Formal approach to digital circuits test scheduling, GACR, Postdoktorandské granty, GP102/03/P176, start: 2003-01-01, end: 2005-12-31, completed
Modern Methods of Digital Systems Design, GACR, Standardní projekty, GA102/04/0737, start: 2004-01-01, end: 2006-12-31, completed
Research groups
Dependable Digital Systems Research Group (RG DEPSYS)
Departments
Department of Computer Systems (DCSY)
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