Result Details

TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT

PAVLÍK, M.; MAGÁT, M.; VRBA, R. TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT. In 6th International conference of PhD students. Miskolc: University of Miskolc, Innovation and Technology Transfer Centre, 2007. p. 343-347. ISBN: 978-963-661-779-0.
Type
conference paper
Language
English
Authors
Pavlík Michal, Ing., Ph.D., UMEL (FEEC), UREL (FEEC)
Magát Martin, Ing., Ph.D., UMEL (FEEC)
Vrba Radimír, prof. Ing., CSc., UAMT (FEEC), UMEL (FEEC)
Abstract

This paper deals with a design, construction and programming equipment of the tips workplace for chip characteristics measurement. Reason, why the experimental tips workplace of wafer probe was built, is to improve existing laboratory task for education. In the laboratory task the Hall voltage generation on silicon chip placed in the magnetic field was measured. However, new possibilities of use of the tips workplace were revealed

Keywords

tips, measurement, silicon chip

Published
2007
Pages
343–347
Proceedings
6th International conference of PhD students
Edition
první
Conference
6th International Conference
ISBN
978-963-661-779-0
Publisher
University of Miskolc, Innovation and Technology Transfer Centre
Place
Miskolc
BibTeX 
@inproceedings{BUT23389,
  author="Michal {Pavlík} and Martin {Magát} and Radimír {Vrba}",
  title="TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT",
  booktitle="6th International conference of PhD students",
  year="2007",
  number="první",
  pages="343--347",
  publisher="University of Miskolc, Innovation and Technology Transfer Centre",
  address="Miskolc",
  isbn="978-963-661-779-0"
}
Departments
Department of Microelectronics (UMEL)
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