Detail výsledku

TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT

PAVLÍK, M.; MAGÁT, M.; VRBA, R. TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT. In 6th International conference of PhD students. Miskolc: University of Miskolc, Innovation and Technology Transfer Centre, 2007. p. 343-347. ISBN: 978-963-661-779-0.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Pavlík Michal, Ing., Ph.D., UMEL (FEKT), UREL (FEKT)
Magát Martin, Ing., Ph.D., UMEL (FEKT)
Vrba Radimír, prof. Ing., CSc., UAMT (FEKT), UMEL (FEKT)
Abstrakt

This paper deals with a design, construction and programming equipment of the tips workplace for chip characteristics measurement. Reason, why the experimental tips workplace of wafer probe was built, is to improve existing laboratory task for education. In the laboratory task the Hall voltage generation on silicon chip placed in the magnetic field was measured. However, new possibilities of use of the tips workplace were revealed

Klíčová slova

tips, measurement, silicon chip

Rok
2007
Strany
343–347
Sborník
6th International conference of PhD students
Vydání
první
Konference
6th International Conference
ISBN
978-963-661-779-0
Vydavatel
University of Miskolc, Innovation and Technology Transfer Centre
Místo
Miskolc
BibTeX 
@inproceedings{BUT23389,
  author="Michal {Pavlík} and Martin {Magát} and Radimír {Vrba}",
  title="TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT",
  booktitle="6th International conference of PhD students",
  year="2007",
  number="první",
  pages="343--347",
  publisher="University of Miskolc, Innovation and Technology Transfer Centre",
  address="Miskolc",
  isbn="978-963-661-779-0"
}
Pracoviště
Ústav mikroelektroniky (UMEL)
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