Result Details

Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory

ZBOŘIL, F., KOTÁSEK, Z. Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory. In Proceedings of the ECI'98. Herlany, SR: SAV, 1998. p. 75-80. ISBN: 80-88786-94-0.
Type
conference paper
Language
English
Authors
Kotásek Zdeněk, doc. Ing., CSc.
Zbořil František, doc. Ing., CSc.
Abstract

The paper deals with an unusual application of the Hopfield neural network for test pattern generation of combinational logic circuits.

Keywords

Hopfield neural network, logic circuits, test pattern generation

Published
1998
Pages
75–80
Proceedings
Proceedings of the ECI'98
Conference
Electronic Computers & Informatics 98
ISBN
80-88786-94-0
Publisher
SAV
Place
Herlany, SR
BibTeX 
@inproceedings{BUT54327,
  author="Zdeněk {Kotásek} and František {Zbořil}",
  title="Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory",
  booktitle="Proceedings of the ECI'98",
  year="1998",
  pages="75--80",
  publisher="SAV",
  address="Herlany, SR",
  isbn="80-88786-94-0"
}
Projects
Methodology and tools for digital circuits testability analysis, GACR, Standardní projekty, GA102/98/1463, start: 1998-01-01, end: 2006-03-31, completed
Departments
(UIVT)
Department of Intelligent Systems (DITS)
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