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RT Level Test Optimization for Low Power Consumption

ŠKARVADA Jaroslav. RT Level Test Optimization for Low Power Consumption. In: MEMICS proceedings 2007. Brno: Ing. Zdeněk Novotný, CSc., 2007, pp. 185-192. ISBN 978-80-7355-077-6.
Czech title
Optimalizace testu na úrovni RT pro nízký příkon
Type
conference paper
Language
english
Authors
Keywords
Register transfer level, power consumption optimization, test vectors reordering, scan cells reordering
Abstract
The paper deals with low power consumption test optimization for register transfer level (RTL) circuits. A model of circuit under test (CUT), based on the theory of sets and relations is defined. In the model, the power consumption is seen as a parameter depending on circuit structure and input data used for the test. Optimization method to reduce power consumption during test application, is presented.
Published
2007
Pages
185-192
Proceedings
MEMICS proceedings 2007
Conference
MEMICS'07 -- 3rd Doctoral Workshop on Mathematical and Engineering Methods in Computer Science, Znojmo, CZ
ISBN
978-80-7355-077-6
Publisher
Ing. Zdeněk Novotný, CSc.
Place
Brno, CZ
BibTeX
@INPROCEEDINGS{FITPUB8504,
   author = "Jaroslav \v{S}karvada",
   title = "RT Level Test Optimization for Low Power Consumption",
   pages = "185--192",
   booktitle = "MEMICS proceedings 2007",
   year = 2007,
   location = "Brno, CZ",
   publisher = "Ing. Zden\v{e}k Novotn\'{y}, CSc.",
   ISBN = "978-80-7355-077-6",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/8504"
}
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