Result Details
EEG Forward Problem Modelling:Comparison of FieldTrip-SimBio and CST EM Studio
LÁČÍK, J.; KOUDELKA, V.; RAIDA, Z.; CUPAL, M.; KUŘÁTKO, D.; WÓJCIK, D., JIŘÍČEK, S.; PIORECKÁ, V.; VEJMOLA, C.;PÁLENÍČEK, T.;BRUNOVSKÝ, M. EEG Forward Problem Modelling:Comparison of FieldTrip-SimBio and CST EM Studio. In CEMi 2018 Proceedings. Stellenbosch: IEEE, 2018. p. 33-34. ISBN: 978-1-5386-7845-9.
Type
conference paper
Language
English
Authors
Láčík Jaroslav, doc. Ing., Ph.D., UREL (FEEC)
KOUDELKA, V.
Raida Zbyněk, prof. Dr. Ing., UREL (FEEC)
Cupal Miroslav, Ing., Ph.D., UREL (FEEC)
Kuřátko David, Ing., REL-SIX (FEEC)
WÓJCIK, D., JIŘÍČEK, S.
PIORECKÁ, V.
VEJMOLA, C.
PÁLENÍČEK, T.
BRUNOVSKÝ, M.
and others
KOUDELKA, V.
Raida Zbyněk, prof. Dr. Ing., UREL (FEEC)
Cupal Miroslav, Ing., Ph.D., UREL (FEEC)
Kuřátko David, Ing., REL-SIX (FEEC)
WÓJCIK, D., JIŘÍČEK, S.
PIORECKÁ, V.
VEJMOLA, C.
PÁLENÍČEK, T.
BRUNOVSKÝ, M.
and others
Abstract
The contribution is focused on the comparison of the accuracy of the solution obtain from the FieldTrip-Simbio and the CST EM Studio. It is showed that the solution from FieldTrip-Simbio can have higher inaccuracy due to either exploitation of the St. Venant's approach for dipole approximation, or not considering the displacement current.
Keywords
EEG forward problem modeling, displacement current
URL
Published
2018
Pages
33–34
Proceedings
CEMi 2018 Proceedings
Conference
International workshop on computing, electromagnetics and machine intelligence
ISBN
978-1-5386-7845-9
Publisher
IEEE
Place
Stellenbosch
DOI
UT WoS
000458403200017
EID Scopus
BibTeX
@inproceedings{BUT151863,
author="LÁČÍK, J. and KOUDELKA, V. and RAIDA, Z. and CUPAL, M. and KUŘÁTKO, D. and WÓJCIK, D., JIŘÍČEK, S. and PIORECKÁ, V. and VEJMOLA, C. and PÁLENÍČEK, T. and BRUNOVSKÝ, M.",
title="EEG Forward Problem Modelling:Comparison of FieldTrip-SimBio and CST EM Studio",
booktitle="CEMi 2018 Proceedings",
year="2018",
pages="33--34",
publisher="IEEE",
address="Stellenbosch",
doi="10.1109/CEMI.2018.8610539",
isbn="978-1-5386-7845-9",
url="https://ieeexplore.ieee.org/document/8610539"
}
Departments