Result Details

Automatic Design of Reliable Systems Based on the Multiple-choice Knapsack Problem

LOJDA, J.; PODIVÍNSKÝ, J.; ČEKAN, O.; PÁNEK, R.; KRČMA, M.; KOTÁSEK, Z. Automatic Design of Reliable Systems Based on the Multiple-choice Knapsack Problem. In Proceedings - 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020. Novi Sad: Institute of Electrical and Electronics Engineers, 2020. p. 1-4. ISBN: 978-1-7281-9938-2.
Type
conference paper
Language
English
Authors
Lojda Jakub, Ing., Ph.D., DCSY (FIT)
Podivínský Jakub, Ing., Ph.D., DCSY (FIT)
Čekan Ondřej, Ing., Ph.D., DCSY (FIT)
Pánek Richard, Ing., Ph.D., DCSY (FIT)
Krčma Martin, Ing., Ph.D., DCSY (FIT)
Kotásek Zdeněk, doc. Ing., CSc., DCSY (FIT), UTKO (FEEC)
Abstract

This paper evaluates the practical usage of the Multiple-choice Knapsack Problem (MCKP) solver to automatically select the proper fault mitigation method for each component to maximize the overall fault tolerance of the whole system. The usage of the MCKP is placed into the context with our fault tolerance automation toolkit, the goal of which is to completely automate the process of fault-tolerant system design on a very general level. To achieve our goal, we present our research on Field Programmable Gate Arrays (FPGAs) for which we have developed the specific components in order to support their fault-tolerant design automation. In our particular case study, the MCKP method on the partitioned system was able to find the solution with 18% less critical bits compared to our previous approach, while even lowering the circuit size. The results indicate that by splitting the system into smaller components and applying the MCKP method, considerably better results in terms of critical bits representation can be achieved.

Keywords

Fault-Tolerant System Design, Electronic Design Automation, Multiple-choice Knapsack Problem, Fault Tolerance Property Estimation, Verification, High-Level Synthesis

Published
2020
Pages
1–4
Proceedings
Proceedings - 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020
Conference
2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems
ISBN
978-1-7281-9938-2
Publisher
Institute of Electrical and Electronics Engineers
Place
Novi Sad
DOI
10.1109/DDECS50862.2020.9095576
UT WoS
000587761500006
EID Scopus
2-s2.0-85085861470
BibTeX 
@inproceedings{BUT164065,
  author="Jakub {Lojda} and Jakub {Podivínský} and Ondřej {Čekan} and Richard {Pánek} and Martin {Krčma} and Zdeněk {Kotásek}",
  title="Automatic Design of Reliable Systems Based on the Multiple-choice Knapsack Problem",
  booktitle="Proceedings - 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020",
  year="2020",
  pages="1--4",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Novi Sad",
  doi="10.1109/DDECS50862.2020.9095576",
  isbn="978-1-7281-9938-2",
  url="https://www.fit.vut.cz/research/publication/12100/"
}
Files
Projects
IT4Innovations excellence in science, MŠMT, Národní program udržitelnosti II, LQ1602, start: 2016-01-01, end: 2020-12-31, completed
Návrh, optimalizace a evaluace aplikačně specifických počítačových systémů, BUT, Vnitřní projekty VUT, FIT-S-20-6309, start: 2020-03-01, end: 2023-02-28, completed
Research groups
Dependable Digital Systems Research Group (RG DEPSYS)
Departments
Department of Computer Systems (DCSY)
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