Result Details
Partial Scan Methodologies - a Survey
KOTÁSEK, Z.; RŮŽIČKA, R. Partial Scan Methodologies - a Survey. sborník konference PDS2000. Ostrava: Elsevier Science, 2000. p. 133-137. ISBN: 0-08-043620-X.
Type
conference paper
Language
English
Authors
Abstract
In the paper the survey of partial scan methodologies is presented.Existing approaches for selecting FFs for partial scan can beclassified as testability analysis based, test generation based andstructural analysis based. In the paper, the results of our researchactivities are described as well. The methodology is based on suchconcepts as Test Input Register (TIR), Test Driver (TDR), Test Receiver(TRV), Test Output Register (TOR) and Test Transmitter (TTR).
Keywords
parial scan, RTL testability analysis
Published
2000
Pages
133–137
Proceedings
sborník konference PDS2000
Conference
PDS 2000
ISBN
0-08-043620-X
Publisher
Elsevier Science
Place
Ostrava
BibTeX
@inproceedings{BUT191915,
author="Zdeněk {Kotásek} and Richard {Růžička}",
title="Partial Scan Methodologies - a Survey",
booktitle="sborník konference PDS2000",
year="2000",
pages="133--137",
publisher="Elsevier Science",
address="Ostrava",
isbn="0-08-043620-X"
}
Projects
Methodology and tools for digital circuits testability analysis, GACR, Standardní projekty, GA102/98/1463, start: 1998-01-01, end: 2006-03-31, completed
Research groups
Departments