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The Test Controller Model Based on The Timed Automaton

MIKA, D.; KOTÁSEK, Z. The Test Controller Model Based on The Timed Automaton. Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems. Ostrava: Marq software s.r.o., 2003. p. 107-114. ISBN: 80-85988-86-0.
Type
conference paper
Language
English
Authors
Mika Daniel, Ing., Ph.D.
Kotásek Zdeněk, doc. Ing., CSc.
Abstract

In the paper the process of the test controller model design andsynthesis on Register Transfer Level (RTL) is described. The principlesof test application to circuit element by the test controller model isdiscussed. The problem of I-path is explained. The formal tool - thetimed automaton - is used as a suitable tool for test controller model.In the end of paper there is a simple example of timed automaton, whichrepresents a model of particular behavior of the test controller.

Keywords

Register Transfer Level (RTL), Circuit Under Test (CUT), Test Controller Model

Published
2003
Pages
107–114
Proceedings
Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems
Conference
MOSIS 2003 - Modelling and Simulation of Systems
ISBN
80-85988-86-0
Publisher
Marq software s.r.o.
Place
Ostrava
BibTeX
@inproceedings{BUT13967,
  author="Daniel {Mika} and Zdeněk {Kotásek}",
  title="The Test Controller Model Based on The Timed Automaton",
  booktitle="Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems",
  year="2003",
  pages="107--114",
  publisher="Marq software s.r.o.",
  address="Ostrava",
  isbn="80-85988-86-0"
}
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