Detail výsledku

The Test Controller Model Based on The Timed Automaton

MIKA, D.; KOTÁSEK, Z. The Test Controller Model Based on The Timed Automaton. Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems. Ostrava: Marq software s.r.o., 2003. p. 107-114. ISBN: 80-85988-86-0.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Mika Daniel, Ing., Ph.D., FIT (FIT)
Kotásek Zdeněk, doc. Ing., CSc.
Abstrakt

In the paper the process of the test controller model design andsynthesis on Register Transfer Level (RTL) is described. The principlesof test application to circuit element by the test controller model isdiscussed. The problem of I-path is explained. The formal tool - thetimed automaton - is used as a suitable tool for test controller model.In the end of paper there is a simple example of timed automaton, whichrepresents a model of particular behavior of the test controller.

Klíčová slova

Register Transfer Level (RTL), Circuit Under Test (CUT), Test Controller Model

Rok
2003
Strany
107–114
Sborník
Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems
Konference
MOSIS 2003 - Modelling and Simulation of Systems
ISBN
80-85988-86-0
Vydavatel
Marq software s.r.o.
Místo
Ostrava
BibTeX 
@inproceedings{BUT13967,
  author="Daniel {Mika} and Zdeněk {Kotásek}",
  title="The Test Controller Model Based on The Timed Automaton",
  booktitle="Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems",
  year="2003",
  pages="107--114",
  publisher="Marq software s.r.o.",
  address="Ostrava",
  isbn="80-85988-86-0"
}
Výzkumné skupiny
Výzkumná skupina Superpočítačových technologií SC@FIT (VZ SC@FIT)
Pracoviště
Ústav počítačových systémů (UPSY)
Nahoru