Result Details

Gamma Ray Damage of Unbiased CCD Image Sensors

Z. Barton, R. Vrba. Gamma Ray Damage of Unbiased CCD Image Sensors. 14th International Scientific and Applied Science Conference. ET2005, 2005. 5 p. ISBN: 954-438-518-5.
Type
conference proceedings
Language
English
Authors
Bartoň Zdeněk, Ing., UMEL (FEEC)
Vrba Radimír, prof. Ing., CSc., UMEL (FEEC)
Abstract

High image quality Charge-coupled device (CCD) image sensors are needed in many
applications. Low noise and high dynamic range are critical parameters required in scientific
and industrial applications. In many of the applications, however, the CCD image sensor can
be irradiated by a ionizing radiation, as alpha, beta, gamma or x-ray. This paper shows
behaviour of low noise, high dynamic range, 1 Megapixel Frame-Transfer CCD FTT1010-M
[1] image sensor radiated by gamma ray radiation. CCD image sensor driver board with
rad-hard components was designed and used during the tests. Results of the investigation will
be used in system for protein crystallization study in microgravity.

Keywords

Gamma Ray, Damage, CCD Image Sensor, Unbiased

Published
2005
Pages
5
Book
14th International Scientific and Applied Science Conference
ISBN
954-438-518-5
Publisher
ET2005
BibTeX
@proceedings{BUT64585,
  editor="Zdeněk {Bartoň} and Radimír {Vrba}",
  title="Gamma Ray Damage of Unbiased CCD Image Sensors",
  year="2005",
  pages="5",
  publisher="ET2005",
  isbn="954-438-518-5"
}
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