Detail výsledku

Gamma Ray Damage of Unbiased CCD Image Sensors

Z. Barton, R. Vrba. Gamma Ray Damage of Unbiased CCD Image Sensors. 14th International Scientific and Applied Science Conference. ET2005, 2005. 5 p. ISBN: 954-438-518-5.
Typ
konferenční sborník (ne stať)
Jazyk
anglicky
Autoři
Bartoň Zdeněk, Ing., UMEL (FEKT)
Vrba Radimír, prof. Ing., CSc., UMEL (FEKT)
Abstrakt

High image quality Charge-coupled device (CCD) image sensors are needed in many
applications. Low noise and high dynamic range are critical parameters required in scientific
and industrial applications. In many of the applications, however, the CCD image sensor can
be irradiated by a ionizing radiation, as alpha, beta, gamma or x-ray. This paper shows
behaviour of low noise, high dynamic range, 1 Megapixel Frame-Transfer CCD FTT1010-M
[1] image sensor radiated by gamma ray radiation. CCD image sensor driver board with
rad-hard components was designed and used during the tests. Results of the investigation will
be used in system for protein crystallization study in microgravity.

Klíčová slova

Gamma Ray, Damage, CCD Image Sensor, Unbiased

Rok
2005
Strany
5
Kniha
14th International Scientific and Applied Science Conference
ISBN
954-438-518-5
Vydavatel
ET2005
BibTeX
@proceedings{BUT64585,
  editor="Zdeněk {Bartoň} and Radimír {Vrba}",
  title="Gamma Ray Damage of Unbiased CCD Image Sensors",
  year="2005",
  pages="5",
  publisher="ET2005",
  isbn="954-438-518-5"
}
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