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Random Test Generation Through a Probabilistic Constrained Grammar

ČEKAN Ondřej a KOTÁSEK Zdeněk. Random Test Generation Through a Probabilistic Constrained Grammar. In: INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Budapešť, 2018, s. 5-8.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Rok
2018
Strany
5-8
Sborník
INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Konference
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2018, Hotel NH Budapest City, Budapešť, HU
Místo
Budapešť, HU
BibTeX
@INPROCEEDINGS{FITPUB11605,
   author = "Ond\v{r}ej \v{C}ekan and Zden\v{e}k Kot\'{a}sek",
   title = "Random Test Generation Through a Probabilistic Constrained Grammar",
   pages = "5--8",
   booktitle = "INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
   year = 2018,
   location = "Budape\v{s}\v{t}, HU",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/11605"
}
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