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Relation Between Fault Tolerance and Reconfiguration in Cellular Systems

SEKANINA Lukáš a DRÁBEK Vladimír. Relation Between Fault Tolerance and Reconfiguration in Cellular Systems. In: 6th IEEE Int. On-Line Testing Workshop. Palma de Mallorca, Spain: IEEE Computer Society Press, 2000, s. 25-30. ISBN 0-7695-0646-1.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
URL
Rok
2000
Strany
25-30
Sborník
6th IEEE Int. On-Line Testing Workshop
Konference
6th IEEE Int. On-Line Testing Workshop, Palma de Mallorca, ES
ISBN
0-7695-0646-1
Vydavatel
IEEE Computer Society Press
Místo
Palma de Mallorca, Spain, US
BibTeX
@INPROCEEDINGS{FITPUB5625,
   author = "Luk\'{a}\v{s} Sekanina and Vladim\'{i}r Dr\'{a}bek",
   title = "Relation Between Fault Tolerance and Reconfiguration in Cellular Systems",
   pages = "25--30",
   booktitle = "6th IEEE Int. On-Line Testing Workshop",
   year = 2000,
   location = "Palma de Mallorca, Spain, US",
   publisher = "IEEE Computer Society Press",
   ISBN = "0-7695-0646-1",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/5625"
}
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