Detail publikace
Formal and Analytical Approaches to the Testability Analysis - the Comparison
KOTÁSEK Zdeněk, RŮŽIČKA Richard a STRNADEL Josef. Formal and Analytical Approaches to the Testability Analysis - the Comparison. In: Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001. Gyor: SZIF-UNIVERSITAS spol. s r. o.., Hungary, 2001, s. 123-128. ISBN 963-7175-16-4.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Kotásek Zdeněk, Doc. Ing., CSc. (UIVT-VVS FEI VUT)
Růžička Richard, Ing. (UIVT FEI VUT)
Strnadel Josef, Ing. (UIVT FEI VUT)
Růžička Richard, Ing. (UIVT FEI VUT)
Strnadel Josef, Ing. (UIVT FEI VUT)
URL
Rok
2001
Strany
123-128
Sborník
Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001
Konference
IEEE Design and Diagnostics of Electronic Circuits and Systems 2001, Gyor, HU
ISBN
963-7175-16-4
Vydavatel
SZIF-UNIVERSITAS spol. s r. o.., Hungary
Místo
Gyor, HU
BibTeX
@INPROCEEDINGS{FITPUB6692, author = "Zden\v{e}k Kot\'{a}sek and Richard R\r{u}\v{z}i\v{c}ka and Josef Strnadel", title = "Formal and Analytical Approaches to the Testability Analysis - the Comparison", pages = "123--128", booktitle = "Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001", year = 2001, location = "Gyor, HU", publisher = "SZIF-UNIVERSITAS Ltd., Hungary", ISBN = "963-7175-16-4", language = "english", url = "https://www.fit.vut.cz/research/publication/6692" }