Detail výsledku

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

STRNADEL, J.; KOTÁSEK, Z. Normalized Testability Measures at RT Level: Utilization and Reasons for Creation. Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems. Vol. I. Ostrava: Marq software s.r.o., 2002. p. 297-304. ISBN: 80-85988-71-2.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Strnadel Josef, Ing., Ph.D.
Kotásek Zdeněk, doc. Ing., CSc.
Abstrakt

The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.

Klíčová slova

Register-transfer level, controllability, observability, testability, testability analysis

Rok
2002
Strany
297–304
Sborník
Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems
Řada
Vol. I.
Konference
36th Spring International Conference MOSIS 2002 Modelling and Simulation of Systems
ISBN
80-85988-71-2
Vydavatel
Marq software s.r.o.
Místo
Ostrava
BibTeX 
@inproceedings{BUT10010,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Normalized Testability Measures at RT Level: Utilization and Reasons for Creation",
  booktitle="Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems",
  year="2002",
  series="Vol. I.",
  pages="297--304",
  publisher="Marq software s.r.o.",
  address="Ostrava",
  isbn="80-85988-71-2",
  url="https://www.fit.vut.cz/research/publication/6917/"
}
Soubory
Výzkumné skupiny
Výzkumná skupina Superpočítačových technologií SC@FIT (VZ SC@FIT)
Pracoviště
Fakulta informačních technologií (FIT)
Ústav počítačových systémů (UPSY)
Nahoru