Detail publikace

Testability Estimation Based on Controllability and Observability Parameters

PEČENKA Tomáš, STRNADEL Josef, KOTÁSEK Zdeněk a SEKANINA Lukáš. Testability Estimation Based on Controllability and Observability Parameters. In: Proceedings of the 9th EUROMICRO Conference on Digital System Design (DSD'06). IEEE CS. Cavtat: IEEE Computer Society, 2006, s. 504-514. ISBN 0-7695-2609-8.
Název česky
Odhad testovatelnosti na základě parametrů řiditelnosti a pozorovatelnosti
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Pečenka Tomáš, Ing. (UPSY FIT VUT)
Strnadel Josef, Ing., Ph.D. (UPSY FIT VUT)
Kotásek Zdeněk, doc. Ing., CSc. (UPSY FIT VUT)
Sekanina Lukáš, prof. Ing., Ph.D. (UPSY FIT VUT)
Klíčová slova

Analýza testovatelnosti, řiditelnost, pozorovatelnost

Abstrakt

In the paper a method for estimation the circuit testability on the Register Transfer Level (RTL) is presented. The method allows to perform fast testability estimation in linear time complexity (regarding the number of components and interconnects of the circuit). Proposed approach is based on utilization of controllability and observability measurement for estimation of overall circuit testability. The application of developed method is demonstrated in a software tool for the development of RTL benchmark circuits with predefined testability properties. The results gained by our testability analysis method are compared with the results of professional ATPG tool. Experiments show the good correlation of the results obtained by our method and professional ATPG tool with significantly lower time complexity when our algorithm is used.

Rok
2006
Strany
504-514
Sborník
Proceedings of the 9th EUROMICRO Conference on Digital System Design (DSD'06)
Řada
IEEE CS
Konference
9th EUROMICRO Conference on Digital System Design, Hotel Croatia, Cavtat, HR
ISBN
0-7695-2609-8
Vydavatel
IEEE Computer Society
Místo
Cavtat, HR
BibTeX 
@INPROCEEDINGS{FITPUB8157,
   author = "Tom\'{a}\v{s} Pe\v{c}enka and Josef Strnadel and Zden\v{e}k Kot\'{a}sek and Luk\'{a}\v{s} Sekanina",
   title = "Testability Estimation Based on Controllability and Observability Parameters",
   pages = "504--514",
   booktitle = "Proceedings of the 9th EUROMICRO Conference on Digital System Design (DSD'06)",
   series = "IEEE CS",
   year = 2006,
   location = "Cavtat, HR",
   publisher = "IEEE Computer Society",
   ISBN = "0-7695-2609-8",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/8157"
}
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