Detail výsledku

Fault Tolerance Properties of Systems Generated with the Use of High-Level Synthesis

LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z. Fault Tolerance Properties of Systems Generated with the Use of High-Level Synthesis. In Proceedings of IEEE East-West Design & Test Symposium. Kazan: IEEE Computer Society, 2018. p. 80-86. ISBN: 978-1-5386-5710-2.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Lojda Jakub, Ing., Ph.D., UPSY (FIT)
Podivínský Jakub, Ing., Ph.D., UPSY (FIT)
Kotásek Zdeněk, doc. Ing., CSc., UPSY (FIT), UTKO (FEKT)
Abstrakt

During the last decades, electronic systems became an important matter of controlling many critical processes. However, those critical processes often require increased reliability. This requirement puts pressure on system developers to make systems reliable. Because of ever growing chip-level integration, capabilities of electronic systems are expanding, and, thus, leading to more complex system architectures, significantly increasing the number of man-hours needed to develop such systems. Many people believe the solution is to move the development to a higher level of abstraction (e.g. an algorithm level) and use the so-called High-Level Synthesis (HLS) for this purpose. In this research, we aimed towards a decision, whether the usage of HLS impacts the resulting reliability properties of the system, and, thus, whether the HLS-generated system matches reliability properties of its corresponding VHDL-implemented version. We found out that, for the selected set of circuits, HLS performs better in terms of resource consumption, but, also, which we consider surprising, in terms of reliability. For the selected set, HLS achieved better reliability by 3.03 percentage points in contrast to the classical approach utilizing a traditional Hardware Description Language (HDL). In these experiments, no redundancy was intentionally inserted into benchmarking circuits.

Klíčová slova

High-Level Synthesis, Fault Tolerance Evaluation, Fault Tolerance Estimation Framework, Catapult C, C++, VHDL.

Rok
2018
Strany
80–86
Sborník
Proceedings of IEEE East-West Design & Test Symposium
Konference
16th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM
ISBN
978-1-5386-5710-2
Vydavatel
IEEE Computer Society
Místo
Kazan
DOI
UT WoS
000517795800018
EID Scopus
BibTeX
@inproceedings{BUT155010,
  author="Jakub {Lojda} and Jakub {Podivínský} and Zdeněk {Kotásek}",
  title="Fault Tolerance Properties of Systems Generated with the Use of High-Level Synthesis",
  booktitle="Proceedings of IEEE East-West Design & Test Symposium",
  year="2018",
  pages="80--86",
  publisher="IEEE Computer Society",
  address="Kazan",
  doi="10.1109/EWDTS.2018.8524631",
  isbn="978-1-5386-5710-2",
  url="https://www.fit.vut.cz/research/publication/11752/"
}
Soubory
Projekty
IT4Innovations excellence in science, MŠMT, Národní program udržitelnosti II, LQ1602, zahájení: 2016-01-01, ukončení: 2020-12-31, ukončen
Pokročilé paralelní a vestavěné počítačové systémy, VUT, Vnitřní projekty VUT, FIT-S-17-3994, zahájení: 2017-03-01, ukončení: 2020-02-29, ukončen
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