Detail výsledku
Wireless device classification through transmitter imperfections — Evaluation of performance degradation due to the chip heating
Maršálek Roman, prof. Ing., Ph.D., UREL (FEKT)
Götthans Tomáš, doc. Ing., Ph.D., UREL (FEKT)
The wireless devices classification based on the transmitter imperfections is one of the promising ways to
provide additional security to future wireless communication networks. Although several aspects, both theoretical and
practical, have been studied recently, there are no studies investigating the degradation of such authentication due to
the environmental changes, such as the device temperature. We present the initial results of measurements of Fclassification method based on the Gaussian mixture model classifier under the influence of temperature variations. With
the use of the widely used USRP devices, we also try to estimate which of the RF impairments is sensitive to such changes.
RF imperfections; physical layer security; IQ imbalances; USRP
@inproceedings{BUT141203,
author="Martin {Pospíšil} and Roman {Maršálek} and Tomáš {Götthans}",
title="Wireless device classification through transmitter imperfections — Evaluation of performance degradation due to the chip heating",
booktitle="Proceedings of IEEE Radio and Wireless Symposium (RWS), 2017",
year="2017",
pages="169--172",
doi="10.1109/RWS.2017.7885978",
isbn="978-1-5090-3446-8"
}