Detail výsledku

Characterization of 3D-knitted Substrates

LÁČÍK, J.; RAIDA, Z.; DŘÍNOVSKÝ, J.; CUPAL, M.; KRÁČALOVÁ, D.; PROCHÁZKA, J.; LÉDROVÁ, Z. Characterization of 3D-knitted Substrates. In Proceedings of MIKON 2020. Varšava, Polsko: IEEE, 2020. p. 241-243. ISBN: 978-83-949421-7-5.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Láčík Jaroslav, doc. Ing., Ph.D., FEKTDěk SO (FEKT), UREL (FEKT)
Raida Zbyněk, prof. Dr. Ing., FEKTDěk SO (FEKT), UREL (FEKT)
Dřínovský Jiří, Ing., Ph.D., FEKTDěk SO (FEKT), REL-SIX (FEKT), UREL (FEKT), UTKO (FEKT)
Cupal Miroslav, Ing., Ph.D., UREL (FEKT)
Kráčalová Dita
Procházka Jiří
Lédrová Zdeňka
Abstrakt

The paper deals with the relative permittivity measurement of the selected types of 3D-knitted fabrics by the two-line method combined with the matrix-pencil method and by the transmission/reflection method. The measured relative permittivity of the fabrics is in the range from 1.17 to 1.23. Further, the fabrics exhibit slight anisotropic behavior. The obtained results can be used for the design of the microwave devices where the 3D knitted fabrics play the role of the substrate.

Klíčová slova

Three-dimensional knitted fabric, dielectric constant measurement, textile-integrated electronics, vehicular applications

URL
Rok
2020
Strany
241–243
Sborník
Proceedings of MIKON 2020
Konference
Microwave and Radar Week (MIKON 2020)
ISBN
978-83-949421-7-5
Vydavatel
IEEE
Místo
Varšava, Polsko
DOI
10.23919/MIKON48703.2020.9253876
UT WoS
000646195700056
EID Scopus
2-s2.0-85097560243
BibTeX 
@inproceedings{BUT165860,
  author="Jaroslav {Láčík} and Zbyněk {Raida} and Jiří {Dřínovský} and Miroslav {Cupal} and Dita {Kráčalová} and Jiří {Procházka} and Zdeňka {Lédrová}",
  title="Characterization of 3D-knitted Substrates",
  booktitle="Proceedings of MIKON 2020",
  year="2020",
  pages="241--243",
  publisher="IEEE",
  address="Varšava, Polsko",
  doi="10.23919/MIKON48703.2020.9253876",
  isbn="978-83-949421-7-5",
  url="https://ieeexplore.ieee.org/document/9253876"
}
Pracoviště
Ústav radioelektroniky (UREL)
Nahoru