Detail výsledku

Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study

PÁNEK, R.; LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z. Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study. In 2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers. Hsinchu: IEEE Computer Society, 2020. p. 121-124. ISBN: 978-1-7281-6083-2.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Pánek Richard, Ing., Ph.D., UPSY (FIT)
Lojda Jakub, Ing., Ph.D., UPSY (FIT)
Podivínský Jakub, Ing., Ph.D., UPSY (FIT)
Kotásek Zdeněk, doc. Ing., CSc., UPSY (FIT), UTKO (FEKT)
Abstrakt

This paper deals with a reliability analysis of a reconfiguration controller which can be a component of a fault-tolerant control system. This controller is designed for an FPGA to be capable of using partial dynamic reconfiguration of the FPGA to mitigate potential faults in the FPGAs configuration memory. These faults, which are called SEUs, can be induced by radiation effects. Therefore, fault tolerance measurement or estimation is very important for designing circuits for critical environments. Thus, the reliability of the reconfiguration controller itself is significant; therefore the Fault Tolerance ESTimation (FT-EST) framework is used for reliability evaluation, which is procured by the discovery of a number of critical configuration bits. Two approaches are used and compared: evaluations of used LUT only, and evaluations of all configuration bits. We ascertained a 20x reduction in time consumption at the expense of a proportional decrease in the amount of critical configuration bits discovered. The obtained results are nearly equivalent.

Klíčová slova

Fault-Tolerant, Partial Dynamic Reconfiguration Controller, Fault Tolerance Property Estimation, FT-EST

Rok
2020
Strany
121–124
Sborník
2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers
Konference
2020 International Symposium on VLSI Design, Automation and Test
ISBN
978-1-7281-6083-2
Vydavatel
IEEE Computer Society
Místo
Hsinchu
DOI
UT WoS
000612045400011
EID Scopus
BibTeX
@inproceedings{BUT168116,
  author="Richard {Pánek} and Jakub {Lojda} and Jakub {Podivínský} and Zdeněk {Kotásek}",
  title="Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study",
  booktitle="2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers",
  year="2020",
  pages="121--124",
  publisher="IEEE Computer Society",
  address="Hsinchu",
  doi="10.1109/VLSI-DAT49148.2020.9196269",
  isbn="978-1-7281-6083-2",
  url="https://www.fit.vut.cz/research/publication/12101/"
}
Soubory
Projekty
IT4Innovations excellence in science, MŠMT, Národní program udržitelnosti II, LQ1602, zahájení: 2016-01-01, ukončení: 2020-12-31, ukončen
Návrh, optimalizace a evaluace aplikačně specifických počítačových systémů, VUT, Vnitřní projekty VUT, FIT-S-20-6309, zahájení: 2020-03-01, ukončení: 2023-02-28, ukončen
Výzkumné skupiny
Pracoviště
Nahoru