Detail výsledku

Gamma Ray Damage of Biased CCD Image Sensors

Z. Barton, R. Vrba. Gamma Ray Damage of Biased CCD Image Sensors. In ASIAN CONFERENCE ON SENSORS AND THE INTERNATIONAL CONFERENCE ON NEW TECHNIQUES IN PHARMACEUTICAL AND BIOMEDICAL RESEARCH. AsiaSense2005, 2005. p. 1-3. ISBN: 0-7803-9371-6.
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Bartoň Zdeněk, Ing., UMEL (FEKT)
Vrba Radimír, prof. Ing., CSc., UMEL (FEKT)
Abstrakt anglicky

High image quality CCD image sensors are needed in many applications. Low noise and high dynamic range are critical parameters required in scientific and industrial applications. In many of the applications, however, the CCD image sensor can be irradiated by a ionizing radiation, as alpha, beta, gamma or x-ray. This paper shows behaviour of low noise, high dynamic range, 1 Megapixel Frame-Transfer CCD FTT1010-M [1] image sensor radiated by gamma ray radiation. CCD image sensor driver board with rad-hard components was designed and used during the tests. Results of the investigation will be used in system for protein crystallization study in microgravity.

Rok
2005
Strany
3
Sborník
ASIAN CONFERENCE ON SENSORS AND THE INTERNATIONAL CONFERENCE ON NEW TECHNIQUES IN PHARMACEUTICAL AND BIOMEDICAL RESEARCH
ISBN
0-7803-9371-6
Vydavatel
AsiaSense2005
BibTeX 
@inproceedings{BUT18472,
  author="Zdeněk {Bartoň} and Radimír {Vrba}",
  title="Gamma Ray Damage of Biased CCD Image Sensors",
  booktitle="ASIAN CONFERENCE ON SENSORS AND THE INTERNATIONAL CONFERENCE ON NEW TECHNIQUES IN PHARMACEUTICAL AND BIOMEDICAL RESEARCH",
  year="2005",
  pages="3",
  publisher="AsiaSense2005",
  isbn="0-7803-9371-6"
}
Pracoviště
Ústav mikroelektroniky (UMEL)
Nahoru