Detail výsledku
Electrochemical measurement System Based on Thick-Film Sensors
Steffan P., Hubalek J., Ficek R., Vrba R. Electrochemical measurement System Based on Thick-Film Sensors. In International Symposium on Communications and Information Technologies 2006. Thailand, Bangkok: IEEE, 2006. 4 p. ISBN: 0-7803-9741-X.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Šteffan Pavel, doc. Bc.Ing., Ph.D., UMEL (FEKT)
Ficek Richard, Ing., UMEL (FEKT), UREL (FEKT)
Hubálek Jaromír, prof. Ing., Ph.D., UMEL (FEKT)
Vrba Radimír, prof. Ing., CSc., UMEL (FEKT)
Ficek Richard, Ing., UMEL (FEKT), UREL (FEKT)
Hubálek Jaromír, prof. Ing., Ph.D., UMEL (FEKT)
Vrba Radimír, prof. Ing., CSc., UMEL (FEKT)
Abstrakt
A new electroanalytical measurement system (micropotentiostat) for electrochemical analysis was designed onto a microchip. The microchip was fabricated in CMOS technology AMIS 0.7 and can store correction data in integrated PROM memory. The microchip was implemented on thick-film sensor to provide potentiometric measurements as cyclic voltammetry, amperommetry, etc. The measurement can be done at wide dynamic range with 8 orders of a current range.
Rok
2006
Strany
4
Sborník
International Symposium on Communications and Information Technologies 2006
Vydání
1.
Konference
ISCIT 2006
ISBN
0-7803-9741-X
Vydavatel
IEEE
Místo
Thailand, Bangkok
Pracoviště
Ústav mikroelektroniky
(UMEL)